The file lemleysampat_replicationfile is the dataset used in "Examiner Characteristics and Patent Office Outcomes" Review of Economics and Statistics, August 2012, 94(3): 817-827. The Stata do file lemleysampatreplicationfile.do generates the results in Tables 1-8 in the paper. Stata 11 was used for the analyses. 

As described in the paper, the patent application data were downloaded from Delphion, a private vendor:

http://www.delphion.com/

We also used information from Delphion to determine the number of pages in the application, family size, and applicant patent volume in 2000. Finally, we used Delphion to identify corresponding EPO applications, and determined the status of these applications at the EPO from the European Patent Register:

http://www.epoline.org

Information on application status and whether patents were granted with (or without) rejections during the prosecution process was collected manually from the Patent Office's Patent Application Information System (PAIR). PAIR also lists examiner names and art unit information.

http://portal.uspto.gov/external/portal/pair

Note that while we collected the data manually when we wrote the paper, the raw data are now hosted by Google:

http://www.google.com/googlebooks/uspto-patents-pair.html

Examiner experience and exit dates were determined from the USPTO examiner roster from 1992 to the present. This was obtained from the USPTO through a Freedom of Information Act (FOIA) request.

For granted patents, information on examiner and application "backward" citations was based on information in the USPTO XML files, now hosted at Google:

http://www.google.com/googlebooks/uspto-patents-grants-biblio.html

The examiner and application citation dataset (for all post-2001 issued patents, not just those used for this analysis) has been posted to Dataverse:

http://dvn.iq.harvard.edu/dvn/dv/boffindata/faces/study/StudyPage.xhtml?globalId=hdl:1902.1/18735&studyListingIndex=1_4a1987770d142802d0849e6e79cb





 